Skip to content

Lawrence Berkeley National Laboratory 88-Inch Cyclotron

The 88-Inch Cyclotron hosts the Berkeley Accelerator Space Effects facility, one of the off-site heavy ion beams JPL’s radiation effects group sends parts to [3]. What distinguishes it is the cocktail: a set of ions of nearly identical charge-to-mass ratio accelerated together, from which the operator selects a species by retuning the cyclotron frequency alone. Because the machine resolves mass to one part in 3000, a species change takes about two minutes [1]. A full cross section against linear energy transfer curve can therefore be measured in one shift, which is the opposite of the position at the NSCL facility, where a species change costs a day.

The cost of that is energy. The cocktails top out at 30 MeV per nucleon, giving ion ranges in silicon of 40 to 1400 micrometers, so most parts must be depackaged and many flip-chip parts thinned before they can be tested here [1][2].

ParameterValue
OperatorLawrence Berkeley National Laboratory [1]
LocationBerkeley, California, United States [1]
CommissionedNot published
TypeCyclotron: heavy ion, light ion and neutron irradiation for single event effects
Floor areaNot published
CapabilitiesHeavy ion, Cave 4B, light ion, Cave 4A
Simulant or terrainNot applicable
InstrumentationFour-quadrant concentric ion chambers; Gafchromic film; cave phosphor and photomultipliers [1]
Ground truthPer-ring flux and fluence with programmable fluence stop; uniformity by film [1]
Fidelity limitsMonoenergetic single-species beam; 30 MeV/u ceiling forces depackaging [1][2]
AccessUser facility; about 2000 beam hours per year across all programs [1]
Cited byradiation testing, FPGAs and logic

The 2000 hours per year covers heavy and light ions, neutrons and microbeams across nuclear physics as well as space effects work, so it is not the space effects allocation [1]. No held source gives a fee schedule or a lead time.

ParameterValue
Working volumeVacuum chamber in Cave 4B; dimensions not published [1]
Test article limitsCeramic cover removed; flip-chip thinned, or not tested at the high LET tune [2]
VacuumYes. Heavy ion exposures are run in vacuum [1]
TemperatureNot published. No in-chamber thermal control is described [1]
IlluminationAlignment laser; beam spread to 5 cm on a cave phosphor for tuning [1]
SlopeNot applicable
Gravity offloadNot applicable
InstrumentationRemote horizontal, vertical and rotational positioning on a motion table [1]

Four standard cocktails run at 4.5, 10, 16 and 30 MeV per nucleon, together covering linear energy transfer from 1 to 100 MeV-cm2/mg at ranges in silicon of 40 to 1400 micrometers and flux up to 1e7 ions/cm2/s [1][3]. Read as two working tunes rather than four cocktails, the envelope a test planner sees is 2 to 100 MeV-cm2/mg at 53 to 80 micrometers of range on the high-LET tune, and 1 to 50 MeV-cm2/mg at 150 to 500 micrometers on the high-penetration tune [2]. On the high-LET tune flip-chip parts should not be tested at all; on the high-penetration tune they can be, thinned, with no heat spreader and no heat sink [2].

Beam cutoff is by manual command, run time, fluence or effective fluence [1]. A collimated milli-beam in the same cave isolates a single event to 10 to 30 micrometers at best, or 100 to 300 micrometers at higher scan rates, using precision slit collimators [1].

The facility description states no uniformity figure over the irradiation area for the heavy ion chamber, no temperature control and no in-situ bias provisions [1]. A campaign needing elevated-temperature latchup screening therefore brings its own thermal arrangement.

ParameterValue
Working volumeCave 4A, samples in air; 10 cm beam with 2.5, 5, 7.5 or 10 cm collimators [1]
Test article limitsSet by the collimator and the in-air standoff [1]
VacuumNone. Samples run in air; low energies can be moved to the Cave 4B chamber [1]
TemperatureNot published
InstrumentationFour-quadrant concentric ion chamber electrodes at 1, 2, 4, 6 and 8 cm [1]

Standard proton energies are 13.5, 20, 30, 40, 50 and 55 MeV at flux up to 1e9 protons/cm2/s, the low end limited by energy loss in the ion chamber and in the air path [1]. Uniformity is verified with Gafchromic film, and the ring electrodes give flux and fluence per ring with a programmable fluence stop. Neutron beams are produced separately by deuteron breakup on a 125 mil beryllium target for high yield or tantalum for low yield, with absolute flux measured by activation foils [1].

The spectrum. A cocktail beam is monoenergetic and single-species; the galactic cosmic ray environment is neither. The general form of that limit, and what can and cannot be argued from a null result at a given species, is on the radiation testing page.

Penetration through a package. At 5 to 50 MeV per nucleon the ion ranges out in the lid, the heat spreader or the substrate before it reaches the sensitive volume, so parts are depackaged and dies thinned [1][2]. A copper heat spreader cuts ion range to 26 percent of the silicon range [2]. Every result taken here is therefore a result on a modified part, and the modification is part of the test record.

A stated capability is not a measured one. The facility description is the operator’s own, with no independent verification and no measurement of delivered dose against a reference [1].

Commercial and radiation-hardened FPGA and memory screening, reported 2020. A NASA survey ran a Xilinx XCKU040 Kintex UltraScale, a Microsemi MPF300T PolarFire and several 3D NAND and MRAM parts here [4]. The PolarFire, thinned to 100 to 120 micrometers, gave a configuration memory upset threshold below 1.16 MeV-cm2/mg at about 3e-7 cm2 per design, and a single event functional interrupt at the same threshold, the core current dropping below 100 mA for 1.7 ms and requiring a system reset [4]. The Kintex UltraScale configuration memory upset threshold was below 0.07 MeV-cm2/mg without scrubbing. On the memories, a Micron MT29F1T08 3D NAND showed no latchup to LET 85 at 78 C, a Hynix H25QFT8F4A9R showed a destructive event at 58.8 MeV-cm2/mg at 80 C on two of two parts, and an Avalanche 40 nm MRAM latched between 21.1 and 58.8 MeV-cm2/mg [4].

Point of load converter single event characterization, reported 2019. The Analog Devices RH3845 step-down controller was exposed to yttrium in vacuum through a 2 mil Kapton degrader and to xenon in air at 45 degrees from a 16 MeV/amu cocktail [5]. Destructive onset averaged 44 V at PVIN over five flight-lot devices at LET 38, with minimal temperature dependence between -5 C and room temperature, which is evidence against a single-event burnout mechanism. A cross-conduction event with an onset LET of 0.1 MeV-cm2/mg was eliminated by raising the in-line gate drive resistance from 2 to 10 ohms, after which two devices took LET 79 to 1e7 ions/cm2 at PVIN up to 100 V with no destructive failure [5]. The functional interrupt mode was removed by holding a pre-load current above 1 mA, verified on five devices at LET 79 with no events [5].

Wide bandgap logic, reported 2019. A NASA GRC 4H-SiC junction FET clock circuit of 175 JFETs showed a single event upset onset between LET 3.5 and 9.7 MeV-cm2/mg, no upsets under neon at 3.5 and upsets under argon at 9.7, with no destructive effect to LET 86 at normal incidence under gold [6]. Isolated D flip-flops showed no upsets, which localizes the sensitivity to the control logic rather than the storage element [6].

Comparator transient screening. The Linear Technology RH1011M comparator’s output transients were fully mitigated by appropriate parasitic output capacitance up to LET 114 MeV-cm2/mg at room temperature and at 100 C, the unfiltered transient cross section being about 1.6 percent of total die area and temperature independent [7].

References

  1. M. Kireeff Covo, Robert A. Albright, B. Ninemire, Michael Johnson, A. Hodgkinson, T. Loew, J. Y. Benitez, D. S. Todd, D.Z. Xie, T. Perry, L. Phair, L. A. Bernstein, James E. Bevins, J. A. Brown, B. L. Goldblum, M. D. Harasty, K.P. Harrig, T. A. Laplace, E. F. Matthews, Adam Bushmaker, David Walker, Vanessa Oklejas, Alan R. Hopkins, D. L. Bleuel, J. Chen and Stephen B. Cronin. (2017). The 88-Inch Cyclotron: A one-stop facility for electronics radiation and detector testing. Measurement. Source
    BibTeX
    @article{covo2017inch,
      title = {The 88-Inch Cyclotron: A one-stop facility for electronics radiation and detector testing},
      author = {M. Kireeff Covo and Robert A. Albright and B. Ninemire and Michael Johnson and A. Hodgkinson and T. Loew and J. Y. Benitez and D. S. Todd and D.Z. Xie and T. Perry and L. Phair and L. A. Bernstein and James E. Bevins and J. A. Brown and B. L. Goldblum and M. D. Harasty and K.P. Harrig and T. A. Laplace and E. F. Matthews and Adam Bushmaker and David Walker and Vanessa Oklejas and Alan R. Hopkins and D. L. Bleuel and J. Chen and Stephen B. Cronin},
      year = {2017},
      journal = {Measurement},
      volume = {127},
      pages = {580-587},
      publisher = {Elsevier BV},
      doi = {10.1016/j.measurement.2017.10.018},
      url = {https://www.osti.gov/biblio/1409927}
    }
  2. Guertin, S. M. (2018). Guideline for Single-Event Effect (SEE) Testing of System on a Chip (SOC) Devices. NASA, 20190002148. Source
    BibTeX
    @techreport{guertin2018guideline,
      title = {Guideline for Single-Event Effect (SEE) Testing of System on a Chip (SOC) Devices},
      author = {Guertin, Steven M.},
      year = {2018},
      institution = {NASA},
      number = {20190002148},
      url = {https://ntrs.nasa.gov/citations/20190002148}
    }
  3. Thorbourn, D. (2013). JPL Radiation Effects Facilities. Source Not a full paper: Facility capability document published by the operating laboratory. No journal or conference paper describes the JPL Radiation Effects Group Co-60 room irradiators. This deposit is the only published statement of the dose rate range and beam envelope.
    BibTeX
    @inproceedings{thorbourn2013jpl,
      title = {JPL Radiation Effects Facilities},
      author = {Thorbourn, Dennis},
      year = {2013},
      booktitle = {JPL Open Repository},
      url = {https://hdl.handle.net/2014/42836},
      sourcequality = {best-available},
      sourcenote = {Facility capability document published by the operating laboratory. No journal or conference paper describes the JPL Radiation Effects Group Co-60 room irradiators. This deposit is the only published statement of the dose rate range and beam envelope.}
    }
  4. Topper, A. D., Lauenstein, J.-M., Wilcox, E. P., Berg, M. D., Campola, M. J., Casey, M. C., Wyrwas, E. J., O'Bryan, M. V., Carstens, T. A., Fedele, C. M., Forney, J. D., Kim, H. S., Osheroff, J. M., Phan, A. M., Chaiken, M. F., Cochran, D. J., Pellish, J. A. and Majewicz, P. J. (2020). NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results. Source
    BibTeX
    @inproceedings{topper2020nasa,
      title = {NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results},
      author = {Topper, Alyson D. and Lauenstein, Jean-Marie and Wilcox, Edward P. and Berg, Melanie D. and Campola, Michael J. and Casey, Megan C. and Wyrwas, Edward J. and O'Bryan, Martha V. and Carstens, Thomas A. and Fedele, Caroline M. and Forney, James D. and Kim, Hak S. and Osheroff, Jason M. and Phan, Anthony M. and Chaiken, Max F. and Cochran, Donna J. and Pellish, Jonathan A. and Majewicz, Peter J.},
      year = {2020},
      booktitle = {2020 IEEE Radiation Effects Data Workshop (REDW)},
      pages = {1--12},
      doi = {10.1109/REDW51883.2020.9325841},
      url = {https://ntrs.nasa.gov/citations/20205007136}
    }
  5. Bozovich, A. N., Barchowsky, A., Allen, G. R., Vartanian, S., Kahn, B. R., Zajac, S. A., Nguyen, D. and Merida, E. W. (2019). Single Event Effects (SEE) and Total Ionizing Dose (TID) test results for a step-down regulator controller evaluated for use in a harsh space radiation environment. JPL Open Repository. Source
    BibTeX
    @inproceedings{bozovich2019single,
      title = {Single Event Effects (SEE) and Total Ionizing Dose (TID) test results for a step-down regulator controller evaluated for use in a harsh space radiation environment},
      author = {Bozovich, Amanda N. and Barchowsky, Ansel and Allen, Gregory R. and Vartanian, Sergeh and Kahn, Branden R. and Zajac, Stephanie A. and Nguyen, Duc and Merida, Elvis W.},
      year = {2019},
      booktitle = {2019 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2019), San Antionio, Texas, July 8-12, 2019},
      publisher = {JPL Open Repository},
      url = {https://hdl.handle.net/2014/51470}
    }
  6. Lauenstein, J.-M., Neudeck, P. G., Ryder, K. L., Wilcox, E. P., Chen, L., Carts, M. A., Wrbanek, S. Y. and Wrbanek, J. D. (2019). Room Temperature Radiation Testing of a 500 C Durable 4H-SiC JFET Integrated Circuit Technology. Source
    BibTeX
    @inproceedings{lauenstein2019room,
      title = {Room Temperature Radiation Testing of a 500 C Durable 4H-SiC JFET Integrated Circuit Technology},
      author = {Lauenstein, Jean-Marie and Neudeck, Philip G. and Ryder, Kaitlyn L. and Wilcox, Edward P. and Chen, Liangyu and Carts, Martin A. and Wrbanek, Susan Y. and Wrbanek, John D.},
      booktitle = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
      year = {2019},
      url = {https://ntrs.nasa.gov/citations/20190031951}
    }
  7. Bozovich, A. and Irom, F. (2017). Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators. JPL Open Repository. Source
    BibTeX
    @inproceedings{bozovich2017compendium,
      title = {Compendium of Single Event Transient (SET) and Total Ionizing Dose (TID) Test Results for Commonly Used Voltage Comparators},
      author = {Bozovich, Amanda and Irom, Farokh},
      year = {2017},
      booktitle = {2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, Louisiana, July 17-21, 2017},
      publisher = {JPL Open Repository},
      url = {https://hdl.handle.net/2014/46386}
    }