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Venus Surface Environment

The Venus surface is about 460 C at about 90 bar of supercritical carbon dioxide with a sulfuric acid aerosol above it [1], which admits two design responses: a sealed, thermally isolated volume with a fixed lifetime, or electronics that operate at ambient temperature.

QuantityValueSource
Surface temperatureabout 460 C[10]
Test reference condition465 C at 90 bar[10]
Surface pressureabout 90 bar[10]
Atmospheric density65 kg/m3[6]
Surface wind speed0.3 to 1.3 m/s, average 0.6 m/s[6]
Diurnal cycle116 days; night exceeds 50 Earth days[6]

Atmospheric density of 65 kg/m3 is about 50 times Earth sea level air, so a 0.6 m/s wind carries useful force despite the low speed [6]. A Savonius rotor produces 3.18 W at the average wind speed. Solar cells have been tested at Venus temperature but work for only half the diurnal cycle, and the night side of that cycle exceeds 50 Earth days [6].

The chemistry is the part that is usually understated. The gas load used to reproduce Venus surface conditions on the ground is carbon dioxide with nitrogen and a set of trace species that attack materials:

SpeciesFraction in the ground simulation mixture
CO296.5 percent
N23.4 percent
SO2130 ppm
COS27 ppm
CO15 ppm
H2O30 ppm
HCl0.5 ppm
NO5.5 ppb
HF5 ppb

All values from [8]. At 460 C, common engineering materials including aluminum are unusable [6].

The recorded lifetime of the sealed-vessel approach

Section titled “The recorded lifetime of the sealed-vessel approach”

Nine of the fourteen Soviet Venera and Vega landers reached the Venus surface, and those nine survived between 23 and 127 minutes before their electronics failed [6]. For a pre-chilled, insulated pressure vessel, lifetime is set by insulation mass and initial internal temperature. There is no repairable failure in that record; the vessel reaches ambient temperature and the electronics stop.

Venus-GRAM is the engineering model. Its lower atmosphere, to 250 km, is the Venus International Reference Atmosphere; its thermosphere from 250 to 1000 km is an MSFC model assuming an isothermal profile initialized from VIRA conditions at 250 km [1].

Known limits of that model matter as much as its contents. The VIRA version included holds Pioneer Venus Orbiter and Probe data plus Venera probe data, but carries no solid planet model and no high resolution gravity model [1]. Venus density varies little over the solar cycle, so that effect is not represented in the VIRA data or in Venus-GRAM at all [1]. Mean zonal wind is taken from VIRA only up to 80 km; above that height the decrease in mean wind and the perturbation magnitudes are parameterized from published models rather than measured.

The 2021 rebuild replaced the custom ephemeris engine with the NAIF SPICE library, converted the code to a C++ framework, and dropped the constant ratio of specific heats that had overestimated the speed of sound by as much as 10 percent [1].

The Glenn Extreme Environment Rig is the facility the endurance numbers below come from.

ParameterValueSource
Vessel304 stainless steel, 3 ft internal diameter by 4 ft long, about 800 L[8], [9]
Maximum rated conditions103 bar at about 530 C[9]
Gas streams9, each handling pure or mixed gases[8], [9]
Fill and heat-up4 working days[9]
Cool-down10 working days[9]
Chemistry verificationIn-line gas chromatograph, with an on-site mass spectrometer available[9]

Reproducing temperature and pressure alone is not sufficient to qualify parts for a prolonged surface mission; the atmospheric chemistry has to be reproduced too [2]. That finding is what makes a facility with nine independently controlled gas streams necessary rather than an oven and a pressure vessel.

The alternative to a sealed vessel is a wide bandgap semiconductor operating at ambient Venus temperature. The flight-relevant technology is the 4H-SiC junction field effect transistor integrated circuit [2].

GenerationTransistorsFunctionGate lengthDieI/O padsSource
1019516-bit RAM6 um3 x 3 mm32[4], [3]
10175divide-by-2/4 clock6 um3 x 3 mm32[4], [3]
11about 1000120-bit RAM6 um4.65 x 4.65 mm-[3]
12about 3000in fabrication3 um5 x 5 mm-[3]

Generation 11 shrank the resistor width from 6 um to 3 um and demonstrated an 8-bit delta-sigma analog-to-digital converter and a 998-bit read-only memory at 500 C, but it yielded and endured worse than Generation 10: no Generation 11 RAM chip had all 120 bits working even at 25 C, and the chips reached about 1000 hours above 460 C rather than the year Generation 10 achieved [3].

DeviceContinuous operation at 500 C in airSource
RAM #210,100 h, 421 days[4]
Clock #210,500 h[4]
Clock #3A and #3B9677 h each[4]
RAM #11525 h[4]

SiC JFET RAM output levels against 500 C test time to 421 days

Source: [4]. Public domain (NASA).

Parameters stabilize 100 to 200 h after first power-on and then drift by under 5 percent for the remainder of the test [4]. Supplies are +25 V and -25 V, with logic high near 0 V and logic low near -10 V. Power at 500 C is 194 mW for the 16-bit RAM, split 116 mW from the positive rail and 78 mW from the negative, and 298 mW for the clock chip, split 185 mW and 113 mW.

The demonstrated temperature range runs from -190 C to a short-duration record of 961 C [4]. Endurance above 500 C is much shorter: at 700 C an MF NOR logic gate ran 142 h and ring oscillator integrated circuits ran under 15 h [5].

The failure mechanism is not the semiconductor. At 500 C it is thermal-stress cracking of the SiO2 / Si3N4 / SiO2 passivation stack, which admits oxygen and oxidizes the TaSi2 metallization at the cracks; at 700 C the cracking is more extensive and propagates through the Metal 1 interconnect [5]. The passivation stack is 1 um TEOS LPCVD SiO2, 67 nm Si3N4 and 1 um TEOS LPCVD SiO2 [4]. Bond pads use a TaSi2/Pt/Ir/Pt stack capped with 1 um of electron-beam gold, with the same stack on the die backside. Packaging is high temperature co-fired ceramic composite with 32 I/O pins [5]. Process anneals are 1360 C in nitrogen for 100 h for dopant activation and 10 h in 96 percent N2 / 4 percent H2 at 500 C after processing [4].

Radiation tolerance is incidental but useful: room temperature testing took individual JFETs to over 7 Mrad(Si) total ionizing dose, and found single event upsets and transients only above a silicon linear energy transfer of about 9.6 MeV-cm2/mg [11]. For an interplanetary cruise the design environment remains the Badhwar-O’Neill galactic cosmic ray model [7].

Demonstrated operation in Venus conditions

Section titled “Demonstrated operation in Venus conditions”
ItemDuration in GEERSource
Packaged SiC divide-by-2/4 clock IC, 465 C at 90 bar60 days[10]
SO2 chemical microsensor platform60 days[2]
Upscaled SiC integrated circuits60 days[2]

A sensor platform built on this technology is targeted at 60 Earth days or longer on the surface [2]. Power is a sodium sulfur battery, a chemistry with terrestrial history that was space qualified on STS-87 in November 1997 and has been operated at 460 C and 92 bar, assumed at 120 Wh/kg for design study purposes. Communications are planned around 10 MHz, demonstrated in 2019, rising to about 100 MHz [2]. None of this requires cooling or environmental sheltering.

References

  1. Justh, H. L., Dwyer Cianciolo, A. M. and Hoffman, J. (2021). Venus Global Reference Atmospheric Model (Venus-GRAM): User Guide. NASA Marshall Space Flight Center, NASA/TM-20210022168. Source
    BibTeX
    @techreport{justh2021venus,
      title = {Venus Global Reference Atmospheric Model (Venus-GRAM): User Guide},
      author = {Justh, H. L. and Dwyer Cianciolo, A. M. and Hoffman, J.},
      year = {2021},
      institution = {NASA Marshall Space Flight Center},
      number = {NASA/TM-20210022168},
      url = {https://ntrs.nasa.gov/citations/20210022168}
    }
  2. Hunter, G. W., Izenberg, N., Oleson, S. R., Newman, J. M., Gilmore, M., Jessup, K. L., Herrick, R., Balcerski, J., Colozza, A., Faller, B., Fincannon, J., Fittje, J., Gyekenyesi, J., Jones, R., Klefman, B., Landis, G., Martini, M., McCarty, S., Packard, T., Smith, D. and Turnbull, E. (2020). Compass Final Report: Venus Bridge Orbiter and Surface Study (V-BOSS). NASA Glenn Research Center, NASA/TP-2020-220152. Source
    BibTeX
    @techreport{hunter2020compass,
      title = {Compass Final Report: Venus Bridge Orbiter and Surface Study (V-BOSS)},
      author = {Hunter, Gary W. and Izenberg, Noam and Oleson, Steven R. and Newman, J. M. and Gilmore, Martha and Jessup, Kandis Lea and Herrick, Robert and Balcerski, Jeffrey and Colozza, Anthony and Faller, Brent and Fincannon, James and Fittje, James and Gyekenyesi, John and Jones, Robert and Klefman, Brandon and Landis, Geoffrey and Martini, Michael and McCarty, Steven and Packard, Thomas and Smith, David and Turnbull, Elizabeth},
      year = {2020},
      institution = {NASA Glenn Research Center},
      number = {NASA/TP-2020-220152},
      url = {https://ntrs.nasa.gov/citations/20200013062}
    }
  3. Neudeck, P. G., Spry, D. J., Krasowski, M. J., Chen, L., Greer, L. C., Chang, C. W., Lukco, D., Beheim, G. M. and Prokop, N. F. (2021). Upscaling of 500 C Durable SiC JFET-R Integrated Circuits. Source
    BibTeX
    @inproceedings{neudeck2021upscaling,
      title = {Upscaling of 500 C Durable SiC JFET-R Integrated Circuits},
      author = {Neudeck, Philip G. and Spry, David J. and Krasowski, Michael J. and Chen, Liangyu and Greer, Lawrence C. and Chang, Carl W. and Lukco, Dorothy and Beheim, Glenn M. and Prokop, Norman F.},
      booktitle = {International Conference and Exhibition on High Temperature Electronics (HiTEC 2020)},
      year = {2021},
      url = {https://ntrs.nasa.gov/citations/20210011191}
    }
  4. Neudeck, P. G., Spry, D. J., Krasowski, M. J., Prokop, N. F., Beheim, G. M., Chen, L.-Y. and Chang, C. W. (2018). Yearlong 500 C Operational Demonstration of Up-scaled 4H-SiC JFET Integrated Circuits. Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). Source
    BibTeX
    @article{neudeck2018yearlong,
      title = {Yearlong 500 C Operational Demonstration of Up-scaled 4H-SiC JFET Integrated Circuits},
      author = {Neudeck, Philip G. and Spry, David J. and Krasowski, Michael J. and Prokop, Norman F. and Beheim, Glenn M. and Chen, Liang-Yu and Chang, Carl W.},
      journal = {Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT)},
      year = {2018},
      doi = {10.4071/2380-4491-2018-hiten-000071},
      volume = {2018},
      pages = {000071-000078}
    }
  5. Neudeck, P. G., Spry, D. J., Chen, L., Lukco, D., Chang, C. W. and Beheim, G. M. (2017). Experimentally Observed Electrical Durability of 4H-SiC JFET ICs Operating from 500 C to 700 C. Materials Science Forum. Source
    BibTeX
    @article{neudeck2017experimentally,
      title = {Experimentally Observed Electrical Durability of 4H-SiC JFET ICs Operating from 500 C to 700 C},
      author = {Neudeck, Philip G. and Spry, David J. and Chen, Liangyu and Lukco, Dorothy and Chang, Carl W. and Beheim, Glenn M.},
      journal = {Materials Science Forum},
      year = {2017},
      doi = {10.4028/www.scientific.net/msf.897.567},
      volume = {897},
      pages = {567-570}
    }
  6. Sauder, J., Hilgemann, E., Johnson, M., Parness, A., Bienstock, B., Hall, J., Kawata, J. and Stack, K. (2017). Automaton Rover for Extreme Environments. NASA Jet Propulsion Laboratory, 20170002798. Source
    BibTeX
    @techreport{sauder2017automaton,
      title = {Automaton Rover for Extreme Environments},
      author = {Sauder, Jonathan and Hilgemann, Evan and Johnson, Michael and Parness, Aaron and Bienstock, Bernie and Hall, Jeffery and Kawata, Jessie and Stack, Kathryn},
      year = {2017},
      institution = {NASA Jet Propulsion Laboratory},
      number = {20170002798},
      url = {https://ntrs.nasa.gov/citations/20170002798}
    }
  7. O'Neill, P. M., Golge, S. and Slaba, T. C. (2014). Implementing the Badhwar-O'Neill Galactic Cosmic Ray Model for Spacecraft Analysis. NASA. Source
    BibTeX
    @techreport{nasa2014implementing,
      title = {Implementing the Badhwar-O'Neill Galactic Cosmic Ray Model for Spacecraft Analysis},
      author = {O'Neill, P. M. and Golge, S. and Slaba, T. C.},
      year = {2014},
      institution = {NASA},
      url = {https://ntrs.nasa.gov/citations/20140009922}
    }
  8. Kremic, T., Vento, D., Lalli, N. and Palinski, T. (2014). Extreme Environment Simulation - Current and New Capabilities to Simulate Venus and Other Planetary Bodies. NASA, 20140013390. Source
    BibTeX
    @inproceedings{kremic2014extreme,
      title = {Extreme Environment Simulation - Current and New Capabilities to Simulate Venus and Other Planetary Bodies},
      author = {Kremic, Tibor and Vento, Dan and Lalli, Nick and Palinski, Timothy},
      year = {2014},
      institution = {NASA},
      number = {20140013390},
      url = {https://ntrs.nasa.gov/citations/20140013390},
      booktitle = {2014 IEEE Aerospace Conference},
      doi = {10.1109/aero.2014.6836350},
      pages = {1-9}
    }
  9. Beckley, B. W., Motil, C. A., Henry, I. M., Chi, I. S. and Sprouse, M. D. (2024). Glenn Extreme Environments Rig (GEER) Facility Users Guide. NASA, 20240012869. Source
    BibTeX
    @inproceedings{beckley2024glenn,
      title = {Glenn Extreme Environments Rig (GEER) Facility Users Guide},
      author = {Beckley, Blake W. and Motil, Craig A. and Henry, Ian M. and Chi, Ike S. and Sprouse, Mark D.},
      year = {2024},
      institution = {NASA},
      number = {20240012869},
      url = {https://ntrs.nasa.gov/citations/20240012869},
      booktitle = {Planetary Science Technology Symposium},
      address = {Cleveland, OH}
    }
  10. Chen, L.-Y., Neudeck, P. G., Meredith, R. D., Lukco, D., Spry, D. J., Nakley, L. M., Phillips, K. G., Beheim, G. M. and Hunter, G. W. (2018). Sixty Earth-Days Test of a Prototype Pt/HTCC Alumina Package in Simulated Venus Environment. NASA, 20180006758. Source
    BibTeX
    @inproceedings{chen2018sixty,
      title = {Sixty Earth-Days Test of a Prototype Pt/HTCC Alumina Package in Simulated Venus Environment},
      author = {Chen, Liang-Yu and Neudeck, Philip G. and Meredith, Roger D. and Lukco, Dorothy and Spry, David J. and Nakley, Leah M. and Phillips, Kyle G. and Beheim, Glenn M. and Hunter, Gary W.},
      year = {2018},
      institution = {NASA},
      number = {20180006758},
      url = {https://ntrs.nasa.gov/citations/20180006758},
      booktitle = {Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT)},
      address = {Albuquerque, NM},
      doi = {10.4071/2380-4491-2018-hiten-0000015},
      volume = {2018},
      pages = {000015-000021}
    }
  11. Lauenstein, J.-M., Neudeck, P. G., Ryder, K. L., Wilcox, E. P., Chen, L., Carts, M. A., Wrbanek, S. Y. and Wrbanek, J. D. (2019). Room Temperature Radiation Testing of a 500 C Durable 4H-SiC JFET Integrated Circuit Technology. Source
    BibTeX
    @inproceedings{lauenstein2019room,
      title = {Room Temperature Radiation Testing of a 500 C Durable 4H-SiC JFET Integrated Circuit Technology},
      author = {Lauenstein, Jean-Marie and Neudeck, Philip G. and Ryder, Kaitlyn L. and Wilcox, Edward P. and Chen, Liangyu and Carts, Martin A. and Wrbanek, Susan Y. and Wrbanek, John D.},
      booktitle = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
      year = {2019},
      url = {https://ntrs.nasa.gov/citations/20190031951}
    }