Memory and Storage

Memory devices and storage architectures used by flown planetary and orbital robotics programs, and the in-flight upset and wear data published for them.

The two long-duration flight records here point in opposite directions. ISS multiplexer DRAM upsets are frequent, individually harmless and corrected inside the refresh cycle [1]. Curiosity’s NAND flash degraded in a way that took a whole computer string out of service [2]. Soft error rate is a design parameter; wear-out is an operations problem. See Notable results below.

Memory and storage devices selected and flown

Part	Manufacturer	Used by	Source
TMS44400 1Mx4 DRAM	Texas Instruments	ISS multiplexers	[1]
MT29F4G08AAA NAND flash	Micron	curiosity	[2][10]
128 Mbyte SDRAM, 8 Gbyte NAND flash	Not named	curiosity (MAHLI), perseverance (Mastcam-Z)	[3][4]
Start-up PROM with MRAM and SDRAM	Cobham Aeroflex	perseverance (SuperCam Body Unit)	[5]
32 kbyte PROM, 128 kbyte MRAM, SDRAM	Not named	perseverance (SuperCam Mast Unit)	[6]
6 Mbyte data bank, two EEPROM banks	Not named	curiosity (ChemCam DPU)	[7]

Ratings and qualification results

TMS44400 1Mx4 DRAM, Texas Instruments: commercial DRAM screened for flight, in the ISS command and data handling multiplexers, the bus that hosts canadarm2 and dextre [1]. Ratings: Eight devices per multiplexer demultiplexer for 33,554,432 bits. A Hamming single-error-correction double-error-detection code is embedded in the DRAM refresh and scrub cycle, which starts every 8 microseconds and takes 8.2 seconds to sweep memory, holding the maximum residence time of a soft error in a data word below 10 microseconds [1]. Qualification: Measured in flight over 2005 to 2017 and set against the Peterson figure-of-merit prediction for the same part. At 10 g/cm2 median shielding, external units, the all-region in-flight rate is 8.5e-8 SEU per bit-day against a figure-of-merit prediction of 2.5e-7, an overestimate by a factor of 2.9 [1]. Of the counts logged from February 2010 through 2017, 39 percent plus or minus 4 fall inside the South Atlantic Anomaly for the twelve external units against 13 percent plus or minus 9 for the eight internal units at about 40 g/cm2, and of the counts outside the anomaly 68 percent plus or minus 4 fall poleward of 40 degrees latitude, a band holding 39 percent of flight time [1].
MT29F4G08AAA NAND flash, Micron, in the Rover Compute Element non-volatile memory card. Non-volatile mass storage in the flight computer string, named to part number only in the thermal fatigue investigation [10]. Ratings: Each RCE carries 512 Mbytes of RAM under VxWorks alongside its flash [2]. Qualification: Wear-out in flight. A failing region of RCE-A NAND flash forced a swap to RCE-B on sol 201. The RCE-B data product partition then failed to mount on sol 2173, forcing a return to RCE-A on sol 2188 until RCE-B was reformatted on sol 2342. RCE-A carried 1,158.793 m of odometry and RCE-B 20,159.565 m, so 94.37 percent of the mission has run on the backup string [2].
128 Mbyte SDRAM, 8 Gbyte NAND flash, vendor not named [3][4]. Camera-local image buffer in the Digital Electronics Assembly. Ratings: The flash is organized as a large image buffer so images can be acquired at maximum camera data rate without consuming rover memory; the SDRAM holds the working image pipeline [3][4]. Qualification: Flown on two rovers since August 2012 and February 2021. The architectural point is that the buffer decouples camera frame rate from the rover computer, which is what allows the onboard pipeline to run at full camera head input rate [3][4].
Start-up PROM with MRAM and SDRAM, Cobham Aeroflex [5]. A start-up read-only memory module, three 2 Mbyte MRAM devices and one 2.5 Gbit SDRAM in the SuperCam Body Unit command and data handling. Ratings: MRAM holds non-volatile program and parameter storage; SDRAM holds volatile program space and data buffers [5]. Qualification: The SUROM can interface with the rover compute element and accept a limited command set that rewrites corrupt program memory on Mars, so a program memory corruption is recoverable in flight rather than terminal [5].
32 kbyte PROM, 128 kbyte MRAM, SDRAM, vendor not named, inside the Mast Unit data processing unit [6]. One-time-programmable boot PROM, non-volatile application store and a 32 M x 16 bit image buffer. Ratings: PROM holds the boot flight software, MRAM the application flight software with transfer function equations and configuration tables, SDRAM the Remote Micro-Imager images and acoustic recordings [6]. The Mast Unit can store three different application codes for redundancy [6]. Qualification: The application software is reprogrammable on Mars by patch command while the boot software is not. SDRAM in this design is explicitly SEU-sensitive and was accepted with a calculated non-destructive failure rate of about one event for the nominal mission [6].
6 Mbyte data bank, two EEPROM banks, vendor not named [7]. Volatile data store with dual non-volatile program banks. Ratings: One EEPROM bank has its write line tied off to the inactive state in hardware so it cannot be written in flight; the other is reprogrammable from the ground [7]. Qualification: Flown since August 2012. The hardware write-lock is the design answer to the corruption risk that SuperCam later answered in software with a SUROM recovery path [7][5].

Upset rates measured in flight, and flash wear-out

The ISS multiplexer DRAM has a twelve-year in-flight upset record set against the prediction made for the same part. ISS multiplexer DRAM upsets are corrected by a Hamming single-error-correction double-error-detection code embedded in the memory refresh and scrub cycle, and every corrected upset is logged with the ISS location, which is what makes the measurement possible [1]. At 10 g/cm2 median shielding the TMS44400 in-flight rate is 8.5e-8 SEU per bit-day against a Peterson figure-of-merit prediction of 2.5e-7, so the prediction is high by a factor of 2.9, inside the factor of 2 to 5 overestimate the method is expected to give. Shielding does not act in one direction. Between February 2010 and 2017 the internal units at about 40 g/cm2 logged fewer upsets inside the South Atlantic Anomaly than the external units at about 10 g/cm2, 13 percent of their counts against 39 percent, and more outside it, a mean of 6030 counts against 5367, which the authors attribute to secondary particle showers raised by galactic cosmic rays in the heavier structure [1]. Added shielding therefore trades trapped-proton upsets for secondary-particle upsets rather than removing upsets.

Flash wear-out, not radiation, took a Curiosity computer string out of service. A failing region of Curiosity RCE-A NAND flash forced a swap to the RCE-B computer string on sol 201; the RCE-B data product partition then failed to mount on sol 2173, forcing a return to RCE-A on sol 2188 until RCE-B was reformatted on sol 2342 [2]. RCE-A has carried 1,158.793 m of odometry and RCE-B 20,159.565 m, so 94.37 percent of the mission has run on what was launched as the backup string.

Thermal fatigue does not explain the first of those failures. Counted against the accelerated cycling test run on the same board design for Mars 2020, the RCE-A flash had accumulated under a third of the cycles at which that test cracked solder joints when it failed to mount on sol 200, while RCE-B, which carried the mission afterward, had accumulated three times as many [10]. The build record runs the same way round: the NVMCAM-B board was reworked several times while NVMCAM-A had clean paperwork. No joint from either flight unit has been inspected, so loss of electrical connectivity is a leading theory rather than a diagnosis, and the sol 2172 root cause was lost when the diagnostic data was compacted.

Ground prediction against measured flight rate

Two DRAM part types have a figure-of-merit prediction made from heavy-ion ground cross sections and a flight rate measured afterwards on the same part [1]:

Part and orbit	Ground prediction	Flight measurement	Ratio
TMS44400 DRAM, ISS	2.5e-7 upsets/bit day	8.5e-8 upsets/bit day	2.9x high
SMJ44100 DRAM, SOHO at L1	1.6e-6 upsets/bit day	5.9e-7 upsets/bit day	2.7x high

TMS44400 DRAM, ISS, Texas Instruments. All-region in-flight rate at 10 g/cm2 median shielding over 2010 to 2017, against a Petersen figure-of-merit prediction built from heavy-ion ground cross sections [1].
SMJ44100 DRAM, SOHO, Texas Instruments. Same method, at Earth-Sun L1 behind 1 g/cm2 of shielding [1].

Both predictions are conservative and by nearly the same factor, which is the behavior a Petersen figure of merit is expected to show. Scaling the measured ISS rate to L1 conditions gives 4.4e-7 upsets/bit day against the 5.9e-7 measured on SOHO, agreeing within a factor of 1.3 [1]: a flight rate carried to another orbit landed closer than either ground prediction did in its own. Both are one part type, so nothing here transfers to a modern deep submicron memory [1]. The two whole-article cases from the same campaign, the ISS crew laptops, are on Processors and spread much wider.

What a write-lock buys

Three of the six rows are the same problem solved three ways. ChemCam ties one EEPROM write line off in hardware [7]. SuperCam’s Body Unit keeps a start-up PROM that can be commanded from the rover to repair corrupt program memory [5]. The SuperCam Mast Unit keeps three application codes in MRAM and makes only the boot image immutable [6]. All three accept that program memory can be corrupted in flight and differ only in what remains trustworthy afterwards.

Non-volatile memory characterized against radiation, not yet flown on a planetary robot

Part	Manufacturer	Facility and date	Source
AS216MA1G2B-ASC	Avalanche Technology	Lawrence Berkeley 88-Inch Cyclotron, May 2019	[8]
ASV016204	Avalanche Technology	Naval Research Laboratory laser, January 2020	[8]
Cypress FRAM	Cypress	Massachusetts General Hospital, June 2019	[8]
MT29F4T08CTHBBM5	Micron	Goddard Space Flight Center, April 2019	[8]
MT29F1T08 3D NAND flash	Micron	Lawrence Berkeley cyclotron, November 2019	[8]
H25QFT8F4A9R-BDF	SK Hynix	Lawrence Berkeley 88-Inch Cyclotron, November 2019	[8]
MSP430, ferroelectric memory	Texas Instruments	In-house dose testing, 2021	[9]

Ratings and campaign results

AS216MA1G2B-ASC, Avalanche Technology [8]. 40 nm CMOS MRAM, tested at the Lawrence Berkeley National Laboratory 88-Inch Cyclotron in May 2019 and under the Naval Research Laboratory laser in June 2019. Ratings: Magnetoresistive cell, so the stored state is not a trapped charge and does not wear with write cycles. Qualification: Single event latch-up observed with a threshold linear energy transfer between 21.1 and 58.8 MeV-cm2/mg; latch-up also triggered by pulsed laser at about 40 pJ [8].
ASV016204, Avalanche Technology [8]. 40 nm CMOS MRAM, tested under the Naval Research Laboratory laser in January 2020 and in Goddard Space Flight Center gamma in February 2020. Ratings: Same cell technology, later lot. Qualification: No single event effects at 80 C under pulsed laser at 21.6 pJ, and no parametric degradation at 1 Mrad(Si) gamma [8].
Cypress FRAM, Cypress, as boot and user memory on the Vorago RH-OBC-1. Ferroelectric non-volatile memory, tested at the Francis Burr Proton Therapy Center at Massachusetts General Hospital. Ratings: Non-volatile without an erase cycle, so no flash wear-out mechanism. Qualification: Both devices took single event functional interrupts under 200 MeV protons [8]. The board had no way to gate their power, so a boot FRAM SEFI left the microcontroller unable to reload boot code without an external power cycle. The vendor mitigation is to power the boot device down when it is not in use.
MT29F4T08CTHBBM5, Micron [8]. 3D NAND flash. Ratings: Multi-level cell mode available. Qualification: Erase circuitry failed at 39 krad(Si) under gamma, with the error rate rising faster in multi-level cell mode than in single-level [8].
MT29F1T08 3D NAND flash, Micron [8]. 3D NAND flash tested under heavy ions at the Lawrence Berkeley National Laboratory 88-Inch Cyclotron in November 2019, on a single part, with the compendium’s reported threshold defined as the highest linear energy transfer at which nothing was seen at an effective fluence of 1e7 particles/cm2. Ratings: a single sample, so the result bounds this part and not the part type. Qualification: no single event latch-up to 85 MeV-cm2/mg at 78 C, the highest linear energy transfer the run reached, with single event functional interrupts observed [8].
H25QFT8F4A9R-BDF, SK Hynix [8]. 3D NAND flash. Ratings: Single-level and triple-level cell modes. Qualification: Upset threshold linear energy transfer below 1.16 MeV-cm2/mg in single-level mode and below 3.08 in triple-level; functional interrupt threshold between 1.54 and 7.27; two parts suffered destructive events at 58.8 MeV-cm2/mg at 80 C [8].
MSP430, ferroelectric memory, Texas Instruments. Microcontroller with a non-volatile ferroelectric program store. Ratings: Program memory immune to the radiation effects that afflict flash program store. Qualification: Carried across the MoonRanger power, thermal and motor control boards on CubeSat flight heritage, with in-house dose testing levied on the boards.

MRAM and FRAM remove the wear-out mechanism that took a Curiosity computer string out of service, and both are non-volatile without an erase cycle. Neither removes single event effects: the 40 nm MRAM latched up under heavy ions, and the FRAM devices on a radiation-hardened board took functional interrupts the board could not recover from [8].

Memory devices in the radiation compendia

Commercial memory characterized at a named beam for the NASA Electronic Parts and Packaging program, none of it flown on a planetary robot. Densities span two orders of magnitude and the upset thresholds do not [11][12].

Part	Manufacturer	Facility	Source
MT29F32G08ABAAA, MT29F64G08CBAAA, MT29F128G08EFAAA	Micron	Texas A and M cyclotron	[11]
MT29F8G08U0M	Micron	Texas A and M cyclotron	[12]
MT46V64M8 SDRAM	Micron	Brookhaven, Indiana	[12]
EDS5104ABTA-75 SDRAM	Elpida	Texas A and M cyclotron	[12]
EDS5108ABTA SDRAM	Elpida	Brookhaven	[11]
K9F8G08U0M, K9G8G08U0A	Samsung	Texas A and M, RADEF	[12]
S29GL512 NOR flash	Spansion	Brookhaven, UC Davis	[12]
22FDX SRAM test vehicle	GlobalFoundries	Goddard gamma irradiator	[8]

Ratings and campaign results

MT29F32G08ABAAA, MT29F64G08CBAAA, MT29F128G08EFAAA, Micron. Commercial planar NAND flash at 32, 64 and 128 Gbit [11]. Ratings: single-level cell array, no error correction inside the device. Qualification: upset threshold below 0.1 MeV-cm2/mg on all three, with saturated cross sections of about 1e-10 cm2 per bit on the 32 Gbit part and about 1e-9 on the other two [11]. A threshold that low is below the lightest ion the beam can deliver, so the number bounds the part from above and does not locate it.
MT29F8G08U0M, Micron [12]. Commercial 8 Gbit single-level cell NAND flash. Ratings: planar array with no on-die error correction. Qualification: destructive high-current spikes observed under heavy ion in PROGRAM mode [12]. The event is mode dependent, so a screen run only in READ passes a part that fails when it is written.
MT46V64M8 SDRAM, Micron. Commercial 64 Mbit DDR SDRAM [12]. Ratings: volatile working memory. Qualification: upset threshold below 8 MeV-cm2/mg under heavy ion at Brookhaven, and a proton upset threshold below 50 MeV at the Indiana University Cyclotron Facility with no latchup at 50 MeV [12].
EDS5104ABTA-75 SDRAM, Elpida. Commercial 512 Mbit SDRAM [12]. Ratings: volatile, no internal error correction. Qualification: upset threshold above 2.7 MeV-cm2/mg with a saturated cross section near 2e-1 per device, a recoverable mode-register functional interrupt above 3.8 MeV-cm2/mg, and above 5.4 MeV-cm2/mg a mode returning over a thousand errors in a row that clears only on a rewrite or a power cycle [12]. The three thresholds sit within a factor of two of each other, so a beam that upsets the part is close to the beam that takes it out of service.
EDS5108ABTA SDRAM, Elpida. Commercial SDRAM of the same family. Ratings: volatile. Qualification: upset and functional-interrupt thresholds both below 2 MeV-cm2/mg at Brookhaven, saturated cross sections about 2e-9 cm2 per bit and 2e-9 cm2 per device [11].
K9F8G08U0M, K9G8G08U0A, Samsung. Commercial 8 Gbit NAND flash, single-level and multi-level cell [12]. Ratings: the multi-level part stores two bits per cell. Qualification: destructive high-current spikes on the single-level part in both READ and PROGRAM modes; on the multi-level part, latchup below 35 MeV-cm2/mg at 25 C and an upset threshold below 4 MeV-cm2/mg at RADEF [12].
S29GL512 NOR flash, Spansion. Commercial 512 Mbit NOR flash [12]. Ratings: execute-in-place program store. Qualification: upset threshold below 4 MeV-cm2/mg under heavy ion at Brookhaven and below 20 MeV under protons at the UC Davis Crocker Nuclear Laboratory, with no latchup in either run [12].
22FDX SRAM test vehicle, GlobalFoundries [8]. Fully depleted silicon-on-insulator SRAM test chip, not a product. Ratings: a process evaluation vehicle rather than a memory part. Qualification: over half the bits were stuck between 300 and 500 krad(Si) of gamma, and the devices remained functional at that level [8].

Every threshold above is a heavy-ion or proton screen taken on two or three parts. None of them carries an upset rate for an orbit, and the two destructive results, the Micron and Samsung single-level parts, are the only entries that bound a part rather than a beam.

SDRAM stuck bits, and one memory with a flight rate

Part	Manufacturer	Facility	Source
IS42S86400B SDRAM	ISSI	JPL cobalt-60	[13]
IS43DR81280 DDR2 SDRAM	ISSI	JPL cobalt-60	[13]
HM-6508 1K CMOS RAM	Harris	Low polar Earth orbit	[14]
HM65656 256K SRAM	Matra	Michigan State NSCL	[15]
71256 256K SRAM	IDT	Michigan State NSCL	[15]

Ratings and campaign results

IS42S86400B SDRAM, ISSI. Commercial SDRAM under gamma at 15 to 20 rad(Si)/s [13]. Ratings: 3.6 V at room temperature, read back at a 32 ms refresh. Qualification: stuck bits appear uniformly across the die with no banding or clustering and no more than one per 8 bit transfer, each analyzed cell covering 2048 bytes [13]. Refreshing the part during irradiation rather than holding it under static bias raised the stuck bit count by up to a factor of 1e5 [13]. Whether the part is being exercised during the exposure changes the answer by five orders of magnitude, which is a test condition and not a part property.
IS43DR81280 DDR2 SDRAM, ISSI. Ratings: 1.9 V, tested both static and with refresh on [13]. Qualification: no device failures to 400 krad(Si) and no stuck bits at all at a 1 s readout, at which point testing stopped [13]. That is where the campaign ended, not where the part failed.
HM-6508 1K CMOS RAM, Harris [14]. Ratings: 384 chips flown in low polar Earth orbit near solar minimum, checked by periodic memory checksum and a monthly full dump against the load file [14]. Qualification: 7.6e-2 upsets per chip-year measured over 731 days from January 1983, or 9.4e-2 counting each bit error rather than each event, against an upper limit of 1.3e-3 latchups per chip-year from two years with no latchup. Of 58 upset events, 47 were single bit and 11 produced 72 bit errors between them, and the affected bits lie adjacent on the die; two independent errors inside one 90 minute verification interval would be expected about once in 13 years, so 19 percent of events are single-track multiple-bit upsets [14]. A prediction built from 88-inch cyclotron data at a critical charge of 0.29 pC crosses the measured band at a few g/cm2 of aluminum, which the authors describe as about the average spacecraft shielding.
HM65656 256K SRAM, Matra [15]. Ratings: delidded for the test. Qualification: upset cross section 1.35e-3 cm2 under 9574 MeV krypton at 7.1 MeV-cm2/mg [15].
71256 256K SRAM, IDT, in a plastic package [15]. Ratings: tested against a delidded part of the same type under a degraded krypton beam. Qualification: the plastic part returned an apparent upset cross section 100 times lower, because the ions ranged out in the package before reaching the sensitive volume [15]. The result is an artifact of the package, and a screen run this way passes a part that has not been irradiated.

The HM-6508 is the only memory in this database with an upset rate measured in orbit rather than derived from a beam, and its multiple-bit fraction, 19 percent of events, is the quantity a single-bit correcting code does not cover [14].

References

Koontz, S. L., Suggs, R. M., Alred, J. W., Worthy, E. S., Boeder, P., Steagall, C. A., Hartman, W. A., Gingras, B. D. and Schmidl, W. D. (2018). The International Space Station Space Radiation Environment: Avionics Systems Performance in Low-Earth Orbit Single Event Effects (SEE) Environments, ICES-2018-69. Source

BibTeX

@inproceedings{koontz2018international,
  title = {The International Space Station Space Radiation Environment: Avionics Systems Performance in Low-Earth Orbit Single Event Effects (SEE) Environments},
  author = {Koontz, Steven L. and Suggs, Robert M. and Alred, John W. and Worthy, Erica S. and Boeder, Paul and Steagall, Courtney A. and Hartman, William A. and Gingras, Benjamin D. and Schmidl, William D.},
  year = {2018},
  booktitle = {48th International Conference on Environmental Systems},
  address = {Albuquerque, NM},
  number = {ICES-2018-69},
  url = {https://hdl.handle.net/2346/74075}
}

Rankin, A., Maimone, M., Biesiadecki, J., Patel, N., Levine, D. and Toupet, O. (2021). Mars Curiosity Rover Mobility Trends During the First Seven Years. Journal of Field Robotics, 5. Source

BibTeX

@article{rankin2021mars,
  title = {Mars Curiosity Rover Mobility Trends During the First Seven Years},
  author = {Rankin, Arturo and Maimone, Mark and Biesiadecki, Jeffrey and Patel, Nikunj and Levine, Dan and Toupet, Olivier},
  year = {2021},
  journal = {Journal of Field Robotics},
  volume = {38},
  number = {5},
  pages = {759--800},
  doi = {10.1002/rob.22011},
  url = {https://www-robotics.jpl.nasa.gov/media/documents/ROB-20-0040_R3.pdf}
}

Edgett, K. S., Yingst, R. A., Ravine, M. A., Caplinger, M. A., Maki, J. N., Ghaemi, F. T., Schaffner, J. A., Bell, I. J. F., Edwards, L. J., Herkenhoff, K. E., Heydari, E., Kah, L. C., Lemmon, M. T., Minitti, M. E., Olson, T. S., Parker, T. J., Rowland, S. K., Schieber, J., Sullivan, R. J., Sumner, D. Y., Thomas, P. C., Jensen, E. H., Simmonds, J. J., Sengstacken, A. J., Willson, R. G. and Goetz, W. (2012). Curiosity's Mars Hand Lens Imager (MAHLI) Investigation. Space Science Reviews. Source

BibTeX

@article{edgett2012curiosity,
  title = {Curiosity's Mars Hand Lens Imager (MAHLI) Investigation},
  author = {Edgett, Kenneth S. and Yingst, R. Aileen and Ravine, Michael A. and Caplinger, Michael A. and Maki, Justin N. and Ghaemi, F. Tony and Schaffner, Jacob A. and Bell, III, James F. and Edwards, Laurence J. and Herkenhoff, Kenneth E. and Heydari, Ezat and Kah, Linda C. and Lemmon, Mark T. and Minitti, Michelle E. and Olson, Timothy S. and Parker, Timothy J. and Rowland, Scott K. and Schieber, Juergen and Sullivan, Robert J. and Sumner, Dawn Y. and Thomas, Peter C. and Jensen, Elsa H. and Simmonds, John J. and Sengstacken, Aaron J. and Willson, Reg G. and Goetz, Walter},
  journal = {Space Science Reviews},
  volume = {170},
  pages = {259--317},
  year = {2012},
  doi = {10.1007/s11214-012-9910-4}
}

Bell, I. J., Maki, J., Mehall, G., Ravine, M., Caplinger, M., Bailey, Z., Brylow, S., Schaffner, J., Kinch, K., Madsen, M., Winhold, A., Hayes, A., Corlies, P., Tate, C., Barrington, M., Cisneros, E., Jensen, E., Paris, K., Crawford, K., Rojas, C., Mehall, L., Joseph, J., Proton, J., Cluff, N., Deen, R., Betts, B., Cloutis, E., Coates, A., Colaprete, A., Edgett, K., Ehlmann, B., Fagents, S., Grotzinger, J., Hardgrove, C., Herkenhoff, K., Horgan, B., Jaumann, R., Johnson, J., Lemmon, M., Paar, G., Caballo-Perucha, M., Gupta, S., Traxler, C., Preusker, F., Rice, M., Robinson, M., Schmitz, N., Sullivan, R. and Wolff, M. (2021). The Mars 2020 Perseverance Rover Mast Camera Zoom (Mastcam-Z) Multispectral, Stereoscopic Imaging Investigation. Space Science Reviews, 24. Source

BibTeX

@article{bell2021mars,
  title = {The Mars 2020 Perseverance Rover Mast Camera Zoom (Mastcam-Z) Multispectral, Stereoscopic Imaging Investigation},
  author = {Bell, III, J.F. and Maki, J.N. and Mehall, G.L. and Ravine, M.A. and Caplinger, M.A. and Bailey, Z.J. and Brylow, S. and Schaffner, J.A. and Kinch, K.M. and Madsen, M.B. and Winhold, A. and Hayes, A.G. and Corlies, P. and Tate, C. and Barrington, M. and Cisneros, E. and Jensen, E. and Paris, K. and Crawford, K. and Rojas, C. and Mehall, L. and Joseph, J. and Proton, J.B. and Cluff, N. and Deen, R.G. and Betts, B. and Cloutis, E. and Coates, A.J. and Colaprete, A. and Edgett, K.S. and Ehlmann, B.L. and Fagents, S. and Grotzinger, J.P. and Hardgrove, C. and Herkenhoff, K.E. and Horgan, B. and Jaumann, R. and Johnson, J.R. and Lemmon, M. and Paar, G. and Caballo-Perucha, M. and Gupta, S. and Traxler, C. and Preusker, F. and Rice, M.S. and Robinson, M.S. and Schmitz, N. and Sullivan, R. and Wolff, M.J.},
  journal = {Space Science Reviews},
  volume = {217},
  number = {24},
  year = {2021},
  doi = {10.1007/s11214-020-00755-x}
}

Maurice, S., Wiens, R., Bernardi, P., Caïs, P., Robinson, S., Nelson, T., Gasnault, O., Reess, J.-M., Deleuze, M., Rull, F., Manrique, J.-A., Abbaki, S., Anderson, R., André, Y., Angel, S., Arana, G., Battault, T., Beck, P., Benzerara, K., Bernard, S., Berthias, J.-P., Beyssac, O., Bonafous, M., Bousquet, B., Boutillier, M., Cadu, A., Castro, K., Chapron, F., Chide, B., Clark, K., Clavé, E., Clegg, S., Cloutis, E., Collin, C., Cordoba, E., Cousin, A., Dameury, J.-C., D'Anna, W., Daydou, Y., Debus, A., Deflores, L., Dehouck, E., Delapp, D., De Los Santos, G., Donny, C., Doressoundiram, A., Dromart, G., Dubois, B., Dufour, A., Dupieux, M., Egan, M., Ervin, J., Fabre, C., Fau, A., Fischer, W., Forni, O., Fouchet, T., Frydenvang, J., Gauffre, S., Gauthier, M., Gharakanian, V., Gilard, O., Gontijo, I., Gonzalez, R., Granena, D., Grotzinger, J., Hassen-Khodja, R., Heim, M., Hello, Y., Hervet, G., Humeau, O., Jacob, X., Jacquinod, S., Johnson, J., Kouach, D., Lacombe, G., Lanza, N., Lapauw, L., Laserna, J., Lasue, J., Le Deit, L., Le Mouélic, S., Le Comte, E., Lee, Q.-M., Legett, I. C., Leveille, R., Lewin, E., Leyrat, C., Lopez-Reyes, G., Lorenz, R., Lucero, B., Madariaga, J., Madsen, S., Madsen, M., Mangold, N., Manni, F., Mariscal, J.-F., Martinez-Frias, J., Mathieu, K., Mathon, R., McCabe, K., McConnochie, T., McLennan, S., Mekki, J., Melikechi, N., Meslin, P.-Y., Micheau, Y., Michel, Y., Michel, J., Mimoun, D., Misra, A., Montagnac, G., Montaron, C., Montmessin, F., Moros, J., Mousset, V., Morizet, Y., Murdoch, N., Newell, R., Newsom, H., Nguyen Tuong, N., Ollila, A., Orttner, G., Oudda, L., Pares, L., Parisot, J., Parot, Y., Pérez, R., Pheav, D., Picot, L., Pilleri, P., Pilorget, C., Pinet, P., Pont, G., Poulet, F., Quantin-Nataf, C., Quertier, B., Rambaud, D., Rapin, W., Romano, P., Roucayrol, L., Royer, C., Ruellan, M., Sandoval, B., Sautter, V., Schoppers, M., Schröder, S., Seran, H.-C., Sharma, S., Sobron, P., Sodki, M., Sournac, A., Sridhar, V., Standarovsky, D., Storms, S., Striebig, N., Tatat, M., Toplis, M., Torre-Fdez, I., Toulemont, N., Velasco, C., Veneranda, M., Venhaus, D., Virmontois, C., Viso, M., Willis, P. and Wong, K. (2021). The SuperCam Instrument Suite on the Mars 2020 Rover: Science Objectives and Mast-Unit Description. Space Science Reviews, 47. Source

BibTeX

@article{maurice2021supercam,
  title = {The SuperCam Instrument Suite on the Mars 2020 Rover: Science Objectives and Mast-Unit Description},
  author = {Maurice, S. and Wiens, R.C. and Bernardi, P. and Caïs, P. and Robinson, S. and Nelson, T. and Gasnault, O. and Reess, J.-M. and Deleuze, M. and Rull, F. and Manrique, J.-A. and Abbaki, S. and Anderson, R.B. and André, Y. and Angel, S.M. and Arana, G. and Battault, T. and Beck, P. and Benzerara, K. and Bernard, S. and Berthias, J.-P. and Beyssac, O. and Bonafous, M. and Bousquet, B. and Boutillier, M. and Cadu, A. and Castro, K. and Chapron, F. and Chide, B. and Clark, K. and Clavé, E. and Clegg, S. and Cloutis, E. and Collin, C. and Cordoba, E.C. and Cousin, A. and Dameury, J.-C. and D'Anna, W. and Daydou, Y. and Debus, A. and Deflores, L. and Dehouck, E. and Delapp, D. and De Los Santos, G. and Donny, C. and Doressoundiram, A. and Dromart, G. and Dubois, B. and Dufour, A. and Dupieux, M. and Egan, M. and Ervin, J. and Fabre, C. and Fau, A. and Fischer, W. and Forni, O. and Fouchet, T. and Frydenvang, J. and Gauffre, S. and Gauthier, M. and Gharakanian, V. and Gilard, O. and Gontijo, I. and Gonzalez, R. and Granena, D. and Grotzinger, J. and Hassen-Khodja, R. and Heim, M. and Hello, Y. and Hervet, G. and Humeau, O. and Jacob, X. and Jacquinod, S. and Johnson, J.R. and Kouach, D. and Lacombe, G. and Lanza, N. and Lapauw, L. and Laserna, J. and Lasue, J. and Le Deit, L. and Le Mouélic, S. and Le Comte, E. and Lee, Q.-M. and Legett, IV, C. and Leveille, R. and Lewin, E. and Leyrat, C. and Lopez-Reyes, G. and Lorenz, R. and Lucero, B. and Madariaga, J.M. and Madsen, S. and Madsen, M. and Mangold, N. and Manni, F. and Mariscal, J.-F. and Martinez-Frias, J. and Mathieu, K. and Mathon, R. and McCabe, K.P. and McConnochie, T. and McLennan, S.M. and Mekki, J. and Melikechi, N. and Meslin, P.-Y. and Micheau, Y. and Michel, Y. and Michel, J.M. and Mimoun, D. and Misra, A. and Montagnac, G. and Montaron, C. and Montmessin, F. and Moros, J. and Mousset, V. and Morizet, Y. and Murdoch, N. and Newell, R.T. and Newsom, H. and Nguyen Tuong, N. and Ollila, A.M. and Orttner, G. and Oudda, L. and Pares, L. and Parisot, J. and Parot, Y. and Pérez, R. and Pheav, D. and Picot, L. and Pilleri, P. and Pilorget, C. and Pinet, P. and Pont, G. and Poulet, F. and Quantin-Nataf, C. and Quertier, B. and Rambaud, D. and Rapin, W. and Romano, P. and Roucayrol, L. and Royer, C. and Ruellan, M. and Sandoval, B.F. and Sautter, V. and Schoppers, M.J. and Schröder, S. and Seran, H.-C. and Sharma, S.K. and Sobron, P. and Sodki, M. and Sournac, A. and Sridhar, V. and Standarovsky, D. and Storms, S. and Striebig, N. and Tatat, M. and Toplis, M. and Torre-Fdez, I. and Toulemont, N. and Velasco, C. and Veneranda, M. and Venhaus, D. and Virmontois, C. and Viso, M. and Willis, P. and Wong, K.W.},
  journal = {Space Science Reviews},
  volume = {217},
  number = {47},
  year = {2021},
  doi = {10.1007/s11214-021-00807-w}
}

Wiens, R. C., Maurice, S., Robinson, S. H., Nelson, A. E., Cais, P., Bernardi, P., Newell, R. T., Clegg, S., Sharma, S. K., Storms, S., Deming, J., Beckman, D., Ollila, A. M., Gasnault, O., Anderson, R. B., André, Y., Angel, S. M., Arana, G., Auden, E., Beck, P., Becker, J., Benzerara, K., Bernard, S., Beyssac, O., Borges, L., Bousquet, B., Boyd, K., Caffrey, M., Carlson, J., Castro, K., Celis, J., Chide, B., Clark, K., Cloutis, E., Cordoba, E. C., Cousin, A., Dale, M., Deflores, L., Delapp, D., Deleuze, M., Dirmyer, M., Donny, C., Dromart, G., Duran, M. G., Egan, M., Ervin, J., Fabre, C., Fau, A., Fischer, W., Forni, O., Fouchet, T., Fresquez, R., Frydenvang, J., Gasway, D., Gontijo, I., Grotzinger, J., Jacob, X., Jacquinod, S., Johnson, J. R., Klisiewicz, R. A., Lake, J., Lanza, N., Laserna, J., Lasue, J., Le Mouélic, S., Legett, I. C., Leveille, R., Lewin, E., Lopez-Reyes, G., Lorenz, R., Lorigny, E., Love, S. P., Lucero, B., Madariaga, J. M., Madsen, M., Madsen, S., Mangold, N., Manrique, J. A., Martinez, J., Martinez-Frias, J., McCabe, K. P., McConnochie, T. H., McGlown, J. M., McLennan, S. M., Melikechi, N., Meslin, P.-Y., Michel, J. M., Mimoun, D., Misra, A., Montagnac, G., Montmessin, F., Mousset, V., Murdoch, N., Newsom, H., Ott, L. A., Ousnamer, Z. R., Pares, L., Parot, Y., Pawluczyk, R., Peterson, C. G., Pilleri, P., Pinet, P., Pont, G., Poulet, F., Provost, C., Quertier, B., Quinn, H., Rapin, W., Reess, J.-M., Regan, A. H., Reyes-Newell, A. L., Romano, P. J., Royer, C., Rull, F., Sandoval, B., Sarrao, J. H., Sautter, V., Schoppers, M. J., Schröder, S., Seitz, D., Shepherd, T., Sobron, P., Dubois, B., Sridhar, V., Toplis, M. J., Torre-Fdez, I., Trettel, I. A., Underwood, M., Valdez, A., Valdez, J., Venhaus, D. and Willis, P. (2021). The SuperCam Instrument Suite on the NASA Mars 2020 Rover: Body Unit and Combined System Tests. Space Science Reviews, 4. Source

BibTeX

@article{wiens2021supercam,
  title = {The SuperCam Instrument Suite on the NASA Mars 2020 Rover: Body Unit and Combined System Tests},
  author = {Wiens, Roger C. and Maurice, Sylvestre and Robinson, Scott H. and Nelson, Anthony E. and Cais, Philippe and Bernardi, Pernelle and Newell, Raymond T. and Clegg, Sam and Sharma, Shiv K. and Storms, Steven and Deming, Jonathan and Beckman, Darrel and Ollila, Ann M. and Gasnault, Olivier and Anderson, Ryan B. and André, Yves and Angel, S. Michael and Arana, Gorka and Auden, Elizabeth and Beck, Pierre and Becker, Joseph and Benzerara, Karim and Bernard, Sylvain and Beyssac, Olivier and Borges, Louis and Bousquet, Bruno and Boyd, Kerry and Caffrey, Michael and Carlson, Jeffrey and Castro, Kepa and Celis, Jorden and Chide, Baptiste and Clark, Kevin and Cloutis, Edward and Cordoba, Elizabeth C. and Cousin, Agnes and Dale, Magdalena and Deflores, Lauren and Delapp, Dorothea and Deleuze, Muriel and Dirmyer, Matthew and Donny, Christophe and Dromart, Gilles and Duran, M. George and Egan, Miles and Ervin, Joan and Fabre, Cecile and Fau, Amaury and Fischer, Woodward and Forni, Olivier and Fouchet, Thierry and Fresquez, Reuben and Frydenvang, Jens and Gasway, Denine and Gontijo, Ivair and Grotzinger, John and Jacob, Xavier and Jacquinod, Sophie and Johnson, Jeffrey R. and Klisiewicz, Roberta A. and Lake, James and Lanza, Nina and Laserna, Javier and Lasue, Jeremie and Le Mouélic, Stéphane and Legett, IV, Carey and Leveille, Richard and Lewin, Eric and Lopez-Reyes, Guillermo and Lorenz, Ralph and Lorigny, Eric and Love, Steven P. and Lucero, Briana and Madariaga, Juan Manuel and Madsen, Morten and Madsen, Soren and Mangold, Nicolas and Manrique, Jose Antonio and Martinez, J.P. and Martinez-Frias, Jesus and McCabe, Kevin P. and McConnochie, Timothy H. and McGlown, Justin M. and McLennan, Scott M. and Melikechi, Noureddine and Meslin, Pierre-Yves and Michel, John M. and Mimoun, David and Misra, Anupam and Montagnac, Gilles and Montmessin, Franck and Mousset, Valerie and Murdoch, Naomi and Newsom, Horton and Ott, Logan A. and Ousnamer, Zachary R. and Pares, Laurent and Parot, Yann and Pawluczyk, Rafal and Peterson, C. Glen and Pilleri, Paolo and Pinet, Patrick and Pont, Gabriel and Poulet, Francois and Provost, Cheryl and Quertier, Benjamin and Quinn, Heather and Rapin, William and Reess, Jean-Michel and Regan, Amy H. and Reyes-Newell, Adriana L. and Romano, Philip J. and Royer, Clement and Rull, Fernando and Sandoval, Benigno and Sarrao, Joseph H. and Sautter, Violaine and Schoppers, Marcel J. and Schröder, Susanne and Seitz, Daniel and Shepherd, Terra and Sobron, Pablo and Dubois, Bruno and Sridhar, Vishnu and Toplis, Michael J. and Torre-Fdez, Imanol and Trettel, Ian A. and Underwood, Mark and Valdez, Andres and Valdez, Jacob and Venhaus, Dawn and Willis, Peter},
  journal = {Space Science Reviews},
  volume = {217},
  number = {4},
  year = {2021},
  doi = {10.1007/s11214-020-00777-5}
}

Wiens, R. C., Maurice, S., Barraclough, B., Saccoccio, M., Barkley, W. C., Bell, I. J. F., Bender, S., Bernardin, J., Blaney, D., Blank, J., Bouyé, M., Bridges, N., Bultman, N., Caïs, P., Clanton, R. C., Clark, B., Clegg, S., Cousin, A., Cremers, D., Cros, A., DeFlores, L., Delapp, D., Dingler, R., D'Uston, C., Dyar, M. D., Elliott, T., Enemark, D., Fabre, C., Flores, M., Forni, O., Gasnault, O., Hale, T., Hays, C., Herkenhoff, K., Kan, E., Kirkland, L., Kouach, D., Landis, D., Langevin, Y., Lanza, N., LaRocca, F., Lasue, J., Latino, J., Limonadi, D., Lindensmith, C., Little, C., Mangold, N., Manhes, G., Mauchien, P., McKay, C., Miller, E., Mooney, J., Morris, R. V., Morrison, L., Nelson, T., Newsom, H., Ollila, A., Ott, M., Pares, L., Perez, R., Poitrasson, F., Provost, C., Reiter, J. W., Roberts, T., Romero, F., Sautter, V., Salazar, S., Simmonds, J. J., Stiglich, R., Storms, S., Striebig, N., Thocaven, J.-J., Trujillo, T., Ulibarri, M., Vaniman, D., Warner, N., Waterbury, R., Whitaker, R., Witt, J. and Wong-Swanson, B. (2012). The ChemCam Instrument Suite on the Mars Science Laboratory (MSL) Rover: Body Unit and Combined System Tests. Space Science Reviews. Source

BibTeX

@article{wiens2012chemcam,
  title = {The ChemCam Instrument Suite on the Mars Science Laboratory (MSL) Rover: Body Unit and Combined System Tests},
  author = {Wiens, Roger C. and Maurice, Sylvestre and Barraclough, Bruce and Saccoccio, Muriel and Barkley, Walter C. and Bell, III, James F. and Bender, Steve and Bernardin, John and Blaney, Diana and Blank, Jennifer and Bouyé, Marc and Bridges, Nathan and Bultman, Nathan and Caïs, Phillippe and Clanton, Robert C. and Clark, Benton and Clegg, Samuel and Cousin, Agnes and Cremers, David and Cros, Alain and DeFlores, Lauren and Delapp, Dorothea and Dingler, Robert and D'Uston, Claude and Dyar, M. Darby and Elliott, Tom and Enemark, Don and Fabre, Cecile and Flores, Mike and Forni, Olivier and Gasnault, Olivier and Hale, Thomas and Hays, Charles and Herkenhoff, Ken and Kan, Ed and Kirkland, Laurel and Kouach, Driss and Landis, David and Langevin, Yves and Lanza, Nina and LaRocca, Frank and Lasue, Jeremie and Latino, Joseph and Limonadi, Daniel and Lindensmith, Chris and Little, Cynthia and Mangold, Nicolas and Manhes, Gerard and Mauchien, Patrick and McKay, Christopher and Miller, Ed and Mooney, Joe and Morris, Richard V. and Morrison, Leland and Nelson, Tony and Newsom, Horton and Ollila, Ann and Ott, Melanie and Pares, Laurent and Perez, René and Poitrasson, Franck and Provost, Cheryl and Reiter, Joseph W. and Roberts, Tom and Romero, Frank and Sautter, Violaine and Salazar, Steven and Simmonds, John J. and Stiglich, Ralph and Storms, Steven and Striebig, Nicolas and Thocaven, Jean-Jacques and Trujillo, Tanner and Ulibarri, Mike and Vaniman, David and Warner, Noah and Waterbury, Rob and Whitaker, Robert and Witt, James and Wong-Swanson, Belinda},
  journal = {Space Science Reviews},
  volume = {170},
  pages = {167--227},
  year = {2012},
  doi = {10.1007/s11214-012-9902-4}
}

Topper, A. D., Lauenstein, J.-M., Wilcox, E. P., Berg, M. D., Campola, M. J., Casey, M. C., Wyrwas, E. J., O'Bryan, M. V., Carstens, T. A., Fedele, C. M., Forney, J. D., Kim, H. S., Osheroff, J. M., Phan, A. M., Chaiken, M. F., Cochran, D. J., Pellish, J. A. and Majewicz, P. J. (2020). NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results. Source

BibTeX

@inproceedings{topper2020nasa,
  title = {NASA Goddard Space Flight Center's Compendium of Radiation Effects Test Results},
  author = {Topper, Alyson D. and Lauenstein, Jean-Marie and Wilcox, Edward P. and Berg, Melanie D. and Campola, Michael J. and Casey, Megan C. and Wyrwas, Edward J. and O'Bryan, Martha V. and Carstens, Thomas A. and Fedele, Caroline M. and Forney, James D. and Kim, Hak S. and Osheroff, Jason M. and Phan, Anthony M. and Chaiken, Max F. and Cochran, Donna J. and Pellish, Jonathan A. and Majewicz, Peter J.},
  year = {2020},
  booktitle = {2020 IEEE Radiation Effects Data Workshop (REDW)},
  pages = {1--12},
  doi = {10.1109/REDW51883.2020.9325841},
  url = {https://ntrs.nasa.gov/citations/20205007136}
}

Whittaker, C. (2021). MR-AVI-0068 Radiation Survival Summary, Revision A. Carnegie Mellon University, MoonRanger Project. Source

BibTeX

@techreport{whittaker2021radiation,
  author = {Whittaker, Chuck},
  title = {MR-AVI-0068 Radiation Survival Summary, Revision A},
  institution = {Carnegie Mellon University, MoonRanger Project},
  year = {2021},
  month = {May},
  url = {https://labs.ri.cmu.edu/moonranger/wp-content/uploads/sites/24/2021/07/MR-AVI-0068_Radiation-Survival-Summary.pdf}
}

Berger, L. N. and Bell, C. (2020). Comparing Cumulative Flight Thermal Fatigue to Ground Test Results for Memory Components on the Mars Curiosity Rover. JPL Open Repository. Source

BibTeX

@inproceedings{berger2020comparing,
  title = {Comparing Cumulative Flight Thermal Fatigue to Ground Test Results for Memory Components on the Mars Curiosity Rover},
  author = {Berger, Lindsey N and Bell, Charles},
  year = {2020},
  booktitle = {Aerospace Testing Seminar 2020, Los Angeles, California, March 31 - April 2, 2020},
  publisher = {JPL Open Repository},
  url = {https://hdl.handle.net/2014/52311}
}

Allen, G. R., Guertin, S. M., Scheick, L. Z., Irom, F. and Zajac, S. (2012). Compendium of recent test results of single event effects conducted by the Jet Propulsion Laboratory. JPL Open Repository. Source

BibTeX

@inproceedings{allen2012compendium,
  title = {Compendium of recent test results of single event effects conducted by the Jet Propulsion Laboratory},
  author = {Allen, Gregory R. and Guertin, Steven M. and Scheick, Leif Z. and Irom, Farokh and Zajac, Stephanie},
  year = {2012},
  publisher = {JPL Open Repository},
  url = {https://hdl.handle.net/2014/42688}
}

McClure, S. S., Allen, G. R., Irom, F., Scheick, L. Z., Adell, P. C. and Miyahira, T. F. (2010). Compendium of test results of recent single event effect tests conducted by the Jet Propulsion Laboratory. JPL Open Repository. Source

BibTeX

@inproceedings{mcclure2010compendium,
  title = {Compendium of test results of recent single event effect tests conducted by the Jet Propulsion Laboratory},
  author = {McClure, Steven S. and Allen, Gregory R. and Irom, Farokh and Scheick, Leif Z. and Adell, Philippe C. and Miyahira, Tetsuo F.},
  year = {2010},
  publisher = {JPL Open Repository},
  url = {https://hdl.handle.net/2014/44752}
}

Amrbar, M. and Guertin, S. M. (2016). Total Ionizing Dose response of SDRAM, DDR2 and DDR3 memories. JPL Open Repository. Source

BibTeX

@inproceedings{amrbar2016total,
  title = {Total Ionizing Dose response of SDRAM, DDR2 and DDR3 memories},
  author = {Amrbar, Mehran and Guertin, Steven M.},
  year = {2016},
  publisher = {JPL Open Repository},
  url = {https://hdl.handle.net/2014/46180}
}

Blake, J. B. and Mandel, R. (1987). On-Orbit Observations of Single-Event Upset in Harris HM-6508 1K RAMs. The Aerospace Corporation for USAF Space Division, SD-TR-86-99 (TR-0086(6940-05)-11, Reissue A). Source

BibTeX

@techreport{blake1987orbit,
  title = {On-Orbit Observations of Single-Event Upset in Harris HM-6508 1K RAMs},
  author = {Blake, J. Bernard and Mandel, R.},
  institution = {The Aerospace Corporation for USAF Space Division},
  number = {SD-TR-86-99 (TR-0086(6940-05)-11, Reissue A)},
  year = {1987},
  url = {https://archive.org/download/DTIC_ADA177208/DTIC_ADA177208.pdf}
}

Ladbury, R., Reed, R. A., Marshall, P. W., LaBel, K. A., Anantaraman, R., Fox, R., Sanderson, D. P., Stolz, A., Yurkon, J., Zeller, A. F. and Stetson, J. W. (2004). Performance of the High-Energy Single-Event Effects Test Facility (SEETF) at Michigan State University's National Superconducting Cyclotron Laboratory (NSCL). NASA, 20040171458. Source

BibTeX

@inproceedings{ladbury2004performance,
  title = {Performance of the High-Energy Single-Event Effects Test Facility (SEETF) at Michigan State University's National Superconducting Cyclotron Laboratory (NSCL)},
  author = {Ladbury, R. and Reed, R. A. and Marshall, P. W. and LaBel, K. A. and Anantaraman, R. and Fox, R. and Sanderson, D. P. and Stolz, A. and Yurkon, J. and Zeller, A. F. and Stetson, J. W.},
  year = {2004},
  institution = {NASA},
  number = {20040171458},
  url = {https://ntrs.nasa.gov/citations/20040171458},
  booktitle = {IEEE Transactions on Nuclear Science},
  address = {Atlanta, GA},
  doi = {10.1109/tns.2004.839300},
  volume = {51},
  pages = {3664-3668}
}